Electron Microscope Specimen Mounts and Holders
Electron Microscopy Sciences Standard Pin SEM Stub Mini, 6.6 x 1.3 mm Head, 9.5 mm Pin, Aluminum
Mini SEM pin stub mount for Cambridge, Leica, ZEISS/LEO, FEI/Philips, CamScan, Tescan, ETEC and Amray. Made from lathe finished ultra-pure aluminum.
Head: 6.6 x 1.3 mm
Pin height: 3/8"
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1" surface, 13/16" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1"
Height: 13/16"
Electron Microscopy Sciences Large Set Screw Vise, Ø25 mmx10 mm (H), Hitachi M4
This set screw vice which is made from machined aluminum with stainless steel allen set screws has an open slot that is 10 mm (.394") wide x 5 mm (.197") deep. It measures 25 mm (1”) dia. x 17.5 mm (0.69”) high.
Type: Hitachi M4
Uline 1-Part Stub Style Inventory Tags - Plain, #0000 - 0999
1-Part Stub Style Inventory Tags-Plain 0000-0999
Uline 1-Part Stub Style Inventory Tags - Pre-Wired, #3000 - 3999
1-Part Stub Style Inventory Tags-Pre-Wired 3000-3999
Electron Microscopy Sciences Calibration Specimen 300-2D, SEM Pin
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Array of Posts. Pitch 297. Al bumps on Si. Use contact or TappingMode.
Mount: SEM Pin
Electron Microscopy Sciences Calibration Specimen 300-2D, Steel disk for AFM
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Array of Posts. Pitch 297. Al bumps on Si. Use contact or TappingMode.
Mount: AFM